A method and apparatus for locating inclusions in a diamond stone
European patent application
|Publication No. 1 211 503|
|Date of publication: 05.06.2002 Bulletin 2002/23|
|Application number: 00204323.0|
|Date of filing: 04.12.2000|
|Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
Designated Extension States:
Diamcad 2018 Antwerp (BE)
Sivovolenko, Serguei Borisovish, Moskou (RU)
van der Steen, Pol 2900 Gooreind (BE)
Sivovolenko, Serguei Borisovish, Moskou (RU)
|Representative: Hoorweg, Petrus Nicolaas et al Arnold & Siedsma,
Advocaten en Octrooigemachtigden, Sweelinckplein 1 2517 GK Den Haag (NL)
|A method and apparatus for locating inclusions in a diamond stone|
|A method and apparatus for localizing inclusions in a diamond, where in said diamond is fixed on a holder, said diamond on the holder is observed under a predetermined angle to obtain an image, further a second measurement is carried out to obtain two data to be calculated in a computer, said second data can be obtained by a depth measurement, or by changing the direction of observation to said diamond, in order to localize the inclusion with respect to the outer surface of said diamond.
Russian Patent No. 2263304 (Application No. 2003119969)
Indian Patent Application No. 860/CHENP/2003
Canadian Patent Application No. 2430694
Israeli Patent Application No. 156,034
Method and System for Improved Optical Modeling of Gemstones
|International Application No.: PCT/EP2008/063307|
|Publication Date: 04.06.2009||International Filing Date: 06.10.2008|
|Chapter 2 Demand Filed: 28.09.2009|
|IPC:||G06T 17/20 (2006.01), G01N 21/87 (2006.01)|
|Applicants:||IDEAL-SCOPE PTY. LTD. [AU/AU]; 110-114 Canterbury Road Canterbury, Victoria 3126 (AU) (All Except US).
SIVOVOLENKO, Sergey Borisovich [RU/FI]; (FI) (US Only).
|Inventor:||SIVOVOLENKO, Sergey Borisovich; (FI).|
|Agent:||D'HALLEWEYN, Nele, Veerle, Trees, Gertrudis; Arnold & Siedsma Sweelinckplein 1 NL-2517 GK The Hague (NL) .|
|Priority Data:||2007906469 27.11.2007 AU|
|Title:||METHOD AND SYSTEM FOR IMPROVED OPTICAL MODELING OF GEMSTONES|
|Abstract:||A method of constructing a virtual model of a gemstone including the steps of performing measurements of the gemstone to construct a three-dimensional (3D) model of an exterior surface of the gemstone; identifying one or more visible inclusions within an interior volume of the gemstone; for each identified inclusion, performing the steps of determining a location and 3D shape of the inclusion within the interior volume of the gemstone; capturing at least one image of the inclusion; using the at least one image to determine relevant optical characteristics of the inclusion; and constructing a 3D virtual model of the inclusion, said model including the 3D shape of the inclusion and optical properties of the inclusion based upon said optical characteristics; constructing a 3D virtual model of the gemstone which includes the 3D virtual model of the exterior surface of the gemstone and the 3D virtual models of the one or more visible inclusions within the interior volume of the gemstone; and generating a dataset representing said 3D virtual model, wherein said dataset may be used in subseguent computer analysis to provide a user with information relating to a visual characteristic of the gemstone.
|Designated States:||AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
|Publication Language:||English (EN)|
|Filing Language:||English (EN)|
Method and Apparatus for Examining a Diamond
United States Patent
|Patent. No.:||US 7,259,839 B2|
|Date of Patent:||Aug.21, 2007|
|Inventor:||Sergey B Sivovolenko, 129323 Sedova Street 13, Building 2, Room 216, Moscow|
|Assignees:||Garry Ian Halloway, Canterbury (AU);
Sergey B. Sivovolenko, Moscow (RU)
|Abstract:||Prior methods of measuring diamond proportions in order to construct a complete model, such as a three dimensional virtual wire-frame model, of a diamond have been found to be inadequate. In particular, there has been no commercially available, automated and objective method for measuring the dimensions of a diamond with similar or greater accuracy that can be achieved with manual gauges or micrometers. The present invention provides a method of measuring a physical characteristic of a facet of a diamond, such as the location of one or more points on an edge of a facet. The method comprises illuminating the diamond to visually distinguish a facet from adjacent facets when viewed from a predetermined location, and then capturing an image of the diamond as viewed from this predetermined location. The image is then analyzed to determine the location of at least one point located on an edge of a facet by identifying a discontinuity in the properties of light transmitted from diamond to the viewing location.